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LABVOLUTION 2019, 21 - 23 May
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Lab Automation

Taking microscopy to the next level

ZEISS is unveiling the new generation of its proven high-performance scanning electron microscopes (SEM). The latest additions to the EVO product range offer improved ease of use, enhanced image quality and seamless integration into multimodal workflows.

29 Nov. 2017
Zeiss_EVO_ferrocerium-particle
Zeiss_EVO_ferrocerium-particle

With so many options to choose from, the equipment in the ZEISS EVO range from microscope specialist ZEISS can be tailored precisely to meet the requirements of life and material sciences and is ideal for routine industrial quality assurance. ZEISS EVO is designed to deliver high-quality data even under difficult conditions, for example if non-conductive parts need to remain unaltered as they’re transferred from one instrument to the next in industrial quality assurance, or when samples such as pollen need to be imaged in their natural hydrated state for classification.

ZEISS EVO is well equipped for all such requirements, with various vacuum modes, such as high vacuum, variable pressure and high pressure, and a variety of different detector technologies (SE, C2D, C2DX, BSE, EDS). An optional lanthanum hexaboride (LaB6) emitter also ensures a brighter electron beam for enhanced image resolution and noise reduction. The intuitive, user-friendly operation of ZEISS EVO makes it suitable for both trained and inexperienced microscope users. "The new ZEISS SmartSEM Touch user interface from ZEISS EVO is so easy to learn that not only experienced microscopists but also our engineers and interns who are not SEM experts are up to speed in 20 minutes," says quality manager Jim Suth, for example, who works in production, research and development for high-performance engines at ECR Engines in the United States and uses ZEISS EVO for material characterization and error analysis. "The system's imaging and analysis functions are a big advantage. The seamless integration into multimodal workflows makes our work much more efficient," he explains.

SEM material characterization forms part of the workflow in many academic and industrial environments where samples are analyzed using different imaging or analysis techniques such as light microscopes or spectrometers. ZEISS EVO can be configured as part of a semi-automated, multimodal workflow in these cases, featuring tools that seamlessly relocate regions of interest and safeguard the integrity of data across a number of processes. In such configurations, ZEISS EVO supports highly productive correlative microscopy and analysis methods that provide users with more meaningful data and a deeper understanding of their samples.

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